Pápa Z. and Budai J. and Hanyecz I. and Csontos J. and Tóth Z.: Depolarization correction method for ellipsometric measurements of large grain zinc-oxide films. [Teaching Resource]
Tóth Z. and Hanyecz I. and Gárdián A. and Budai J. and Csontos J. and Pápa Z. and Füle M.: Ellipsometric analysis of KrF laser textured silicon surfaces. [Teaching Resource]