Tóth Z. and Hanyecz I. and Gárdián A. and Budai J. and Csontos J. and Pápa Z. and Füle M.: Ellipsometric analysis of KrF laser textured silicon surfaces. [Teaching Resource]
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Ellipsometric analysis of KrF laser textured silicon surfaces
| Item Type: | Teaching Resource |
|---|---|
| English title: | Ellipsometric analysis of KrF laser textured silicon surfaces |
| Number of Pages: | 1 |
| Language: | English |
| Learning Material Type: | handout |
| Projects: | TÁMOP-4.2.2/B-10/1-2010-0012 |
| Faculty: | Faculty of Science and Informatics |
| Subjects: | 01. Natural sciences 01. Natural sciences > 01.03. Physical sciences |
| Date Deposited: | 2020. Dec. 12. 13:59 |
| Last Modified: | 2020. Dec. 12. 13:59 |
| URI: | https://eta.bibl.u-szeged.hu/id/eprint/4298 |
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