Ellipsometric analysis of KrF laser textured silicon surfaces

Tóth, Z. and Hanyecz, I. and Gárdián, A. and Budai, J. and Csontos, J. and Pápa, Z. and Füle, M.: Ellipsometric analysis of KrF laser textured silicon surfaces. [Teaching Resource]

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Ellipsometric analysis of KrF laser textured silicon surfaces

Item Type: Teaching Resource
English title: Ellipsometric analysis of KrF laser textured silicon surfaces
Number of Pages: 1
Language: English
Learning Material Type: handout
Projects: TÁMOP-4.2.2/B-10/1-2010-0012
Faculty: Faculty of Science and Informatics
Subjects: 01. Natural sciences
01. Natural sciences > 01.03. Physical sciences
Date Deposited: 2020. Dec. 12. 13:59
Last Modified: 2020. Dec. 12. 13:59
URI: https://eta.bibl.u-szeged.hu/id/eprint/4298

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